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Information card for entry 7215823
Preview
| Coordinates | 7215823.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H20 F4 N10 O8 |
|---|---|
| Calculated formula | C36 H20 F4 N10 O8 |
| SMILES | C1(C(C(F)=C(C(C=1F)=C(C#N)C#N)F)=C(C#N)C#N)F.c1cc[n+](cc1)Cc1cc(N(=O)=O)cc(N(=O)=O)c1.c1cc[n+](cc1)Cc1cc(N(=O)=O)cc(N(=O)=O)c1 |
| Title of publication | Structural and optical investigations of charge transfer complexes involving the F4TCNQ dianion |
| Authors of publication | Sutton, Ashley L.; Abrahams, Brendan F.; D'Alessandro, Deanna M.; Elliott, Robert W.; Hudson, Timothy A.; Robson, Richard; Usov, Pavel M. |
| Journal of publication | CrystEngComm |
| Year of publication | 2014 |
| a | 8.2034 ± 0.0005 Å |
| b | 10.8428 ± 0.001 Å |
| c | 10.9912 ± 0.001 Å |
| α | 95.047 ± 0.007° |
| β | 109.56 ± 0.007° |
| γ | 108.643 ± 0.007° |
| Cell volume | 851.82 ± 0.14 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 1 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0554 |
| Residual factor for significantly intense reflections | 0.0383 |
| Weighted residual factors for significantly intense reflections | 0.1014 |
| Weighted residual factors for all reflections included in the refinement | 0.1076 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.1 |
| Diffraction radiation wavelength | 1.5418 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7215823.html
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Users of the data should acknowledge the original authors of the
structural data.