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Information card for entry 7215979
Preview
| Coordinates | 7215979.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Compound 1a |
|---|---|
| Formula | C179 H165 Cl6 N33 O22 |
| Calculated formula | C179 H141 Cl6 N33 O22 |
| SMILES | C(=[NH+]/N=C/c1c(ccc2ccccc12)O)(N/N=C/c1c(ccc2ccccc12)O)N/N=C/c1c(ccc2ccccc12)O.CN(C)C=O.[Cl-].O |
| Title of publication | Capsule voided nanospace confinement in a π-stacked supramolecular organic solid |
| Authors of publication | Chaudhari, Abhijeet K.; Sharma, Amitosh; Mukherjee, Soumya; Joarder, Biplab; Ghosh, Sujit K. |
| Journal of publication | CrystEngComm |
| Year of publication | 2014 |
| Journal volume | 16 |
| Journal issue | 22 |
| Pages of publication | 4691 |
| a | 31.788 ± 0.002 Å |
| b | 18.353 ± 0.002 Å |
| c | 34.619 ± 0.004 Å |
| α | 90° |
| β | 107.82° |
| γ | 90° |
| Cell volume | 19228 ± 3 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.2711 |
| Residual factor for significantly intense reflections | 0.1279 |
| Weighted residual factors for significantly intense reflections | 0.3014 |
| Weighted residual factors for all reflections included in the refinement | 0.3864 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.998 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7215979.html
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