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Information card for entry 7217958
Preview
| Coordinates | 7217958.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | bis(N,N-dimethylurea) succinic acid |
|---|---|
| Chemical name | bis(N,N-dimethylurea) butanedioic acid |
| Formula | C10 H22 N4 O6 |
| Calculated formula | C10 H22 N4 O6 |
| SMILES | C(=O)(N)N(C)C.C(=O)(N)N(C)C.C(=O)(CCC(=O)O)O |
| Title of publication | Engineering short, strong hydrogen bonds in urea di-carboxylic acid complexes |
| Authors of publication | Jones, Andrew O. F.; Leech, Charlotte K.; McIntyre, Garry J.; Wilson, Chick C.; Thomas, Lynne H. |
| Journal of publication | CrystEngComm |
| Year of publication | 2014 |
| Journal volume | 16 |
| Journal issue | 35 |
| Pages of publication | 8177 |
| a | 8.4 ± 0.005 Å |
| b | 5.47 ± 0.005 Å |
| c | 15.47 ± 0.005 Å |
| α | 90° |
| β | 101.95 ± 0.01° |
| γ | 90° |
| Cell volume | 695.4 ± 0.8 Å3 |
| Cell temperature | 50 K |
| Ambient diffraction temperature | 50 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.08 |
| Residual factor for significantly intense reflections | 0.0473 |
| Weighted residual factors for significantly intense reflections | 0.0777 |
| Weighted residual factors for all reflections included in the refinement | 0.0838 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.217 |
| Diffraction radiation type | neutron |
| Duplicate of | 7214493 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7217958.html
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