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Information card for entry 7219024
Preview
| Coordinates | 7219024.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H66 Cl N O11 |
|---|---|
| Calculated formula | C42 H56 Cl N O8 |
| Title of publication | Encapsulation of secondary and tertiary ammonium salts by resorcinarenes and pyrogallarenes: the effect of size and charge concentration |
| Authors of publication | Beyeh, N. K.; Pan, F.; Valkonen, A.; Rissanen, K. |
| Journal of publication | CrystEngComm |
| Year of publication | 2015 |
| Journal volume | 17 |
| Journal issue | 5 |
| Pages of publication | 1182 |
| a | 22.4355 ± 0.0013 Å |
| b | 12.3522 ± 0.0006 Å |
| c | 15.3459 ± 0.0007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4252.8 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173.15 K |
| Number of distinct elements | 5 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.113 |
| Residual factor for significantly intense reflections | 0.0793 |
| Weighted residual factors for significantly intense reflections | 0.1485 |
| Weighted residual factors for all reflections included in the refinement | 0.1652 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7219024.html
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Users of the data should acknowledge the original authors of the
structural data.