Information card for entry 7220191
| Formula |
C44 H52 Cu4 N4 O16 |
| Calculated formula |
C44 H52 Cu4 N4 O16 |
| SMILES |
c12C=[N]3C[C@H]([O]45[Cu]63(Oc1c(ccc2)OC)[O]12[C@@H](C[N]3=Cc7c(c(ccc7)OC)O[Cu]413[O]13[C@H](C[N]4[Cu]51(Oc1c(cccc1C=4)OC)[O]16[C@H](C[N]4[Cu]231Oc1c(cccc1C=4)OC)CO)CO)CO)CO |
| Title of publication |
Cubane-type {M4O4} (M = CoII, ZnII, CuII) clusters: synthesis, crystal structures, and luminescent and magnetic properties |
| Authors of publication |
Gao, Qian; Qin, Yaru; Chen, Yanmei; Liu, Wei; Li, Hai-Yan; Wu, Bing; Li, Yahong; Li, Wu |
| Journal of publication |
RSC Adv. |
| Year of publication |
2015 |
| a |
15.4331 ± 0.0019 Å |
| b |
15.4331 ± 0.0019 Å |
| c |
9.4388 ± 0.0017 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2248.1 ± 0.6 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
86 |
| Hermann-Mauguin space group symbol |
P 42/n :2 |
| Hall space group symbol |
-P 4bc |
| Residual factor for all reflections |
0.0451 |
| Residual factor for significantly intense reflections |
0.0331 |
| Weighted residual factors for significantly intense reflections |
0.0894 |
| Weighted residual factors for all reflections included in the refinement |
0.0972 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.045 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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