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Information card for entry 7220526
Preview
| Coordinates | 7220526.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | CZTSe |
|---|---|
| Chemical name | Copper Zinc Tin selenide |
| Formula | Cu2 Se4 Sn Zn |
| Calculated formula | Cu2 Se4 Sn Zn |
| Title of publication | The stability domain of the selenide kesterite photovoltaic materials and NMR investigation of the Cu/Zn disorder in Cu2ZnSnSe4 (CZTSe). |
| Authors of publication | Choubrac, Léo; Lafond, Alain; Paris, Michaël; Guillot-Deudon, Catherine; Jobic, Stéphane |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2015 |
| Journal volume | 17 |
| Journal issue | 23 |
| Pages of publication | 15088 - 15092 |
| a | 5.69647 ± 0.00005 Å |
| b | 5.69647 ± 0.00005 Å |
| c | 11.3394 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 367.961 ± 0.008 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 121 |
| Hermann-Mauguin space group symbol | I -4 2 m |
| Hall space group symbol | I -4 2 |
| Residual factor for all reflections | 0.0363 |
| Residual factor for significantly intense reflections | 0.0275 |
| Weighted residual factors for significantly intense reflections | 0.0994 |
| Weighted residual factors for all reflections included in the refinement | 0.109 |
| Goodness-of-fit parameter for significantly intense reflections | 1.77 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.86 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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