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Information card for entry 7221572
Preview
| Coordinates | 7221572.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Common name | 5-(3,5-dimethylphenyl)-2-formylpyrrole |
|---|---|
| Chemical name | 5-(3,5-dimethylphenyl)-1H-pyrrole-2-carbaldehyde |
| Formula | C13 H13 N O |
| Calculated formula | C13 H13 N O |
| SMILES | O=Cc1[nH]c(cc1)c1cc(cc(c1)C)C |
| Title of publication | Exploring the influence of steric hindrance and electronic nature of substituents in the supramolecular arrangements of 5-(substituted phenyl)-2-formylpyrroles |
| Authors of publication | Figueira, Cláudia A.; Lopes, Patrícia S.; Gomes, Clara S. B.; Veiros, Luís F.; Gomes, Pedro T. |
| Journal of publication | CrystEngComm |
| Year of publication | 2015 |
| Journal volume | 17 |
| Journal issue | 33 |
| Pages of publication | 6406 |
| a | 8.0139 ± 0.0018 Å |
| b | 13.509 ± 0.002 Å |
| c | 10.342 ± 0.002 Å |
| α | 90° |
| β | 102.552 ± 0.009° |
| γ | 90° |
| Cell volume | 1092.9 ± 0.4 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1782 |
| Residual factor for significantly intense reflections | 0.1218 |
| Weighted residual factors for significantly intense reflections | 0.2843 |
| Weighted residual factors for all reflections included in the refinement | 0.2996 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.897 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7221572.html
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Users of the data should acknowledge the original authors of the
structural data.