Information card for entry 7222459
| Common name |
Sn Alpha |
| Formula |
Sn |
| Calculated formula |
Sn |
| SMILES |
[Sn] |
| Title of publication |
In situ X-ray diffraction study on the formation of α-Sn in nanocrystalline Sn-based electrodes for lithium-ion batteries |
| Authors of publication |
Oehl, Nikolas; Schmuelling, Guido; Knipper, Martin; Kloepsch, Richard; Placke, Tobias; Kolny-Olesiak, Joanna; Plaggenborg, Thorsten; Winter, Martin; Parisi, Juergen |
| Journal of publication |
CrystEngComm |
| Year of publication |
2015 |
| Journal volume |
17 |
| Journal issue |
44 |
| Pages of publication |
8500 |
| a |
6.467 ± 0.002 Å |
| b |
6.4665284 Å |
| c |
6.4665284 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
270.42 ± 0.08 Å3 |
| Number of distinct elements |
1 |
| Space group number |
227 |
| Hermann-Mauguin space group symbol |
F d -3 m :1 |
| Hall space group symbol |
F 4d 2 3 -1d |
| Residual factor for all reflections |
0.0518853 |
| Weighted residual factors for all reflections |
0.0758787 |
| Goodness-of-fit parameter for all reflections |
0.0261653 |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/7222459.html
