Information card for entry 7223026
| Common name |
dithieno[3,2-b:2',3'-d]phosphole |
| Formula |
C26 H16 N O P S2 |
| Calculated formula |
C26 H16 N O P S2 |
| SMILES |
s1ccc2P(=O)(c3c(scc3)c12)c1c(n2c3ccccc3c3ccccc23)cccc1 |
| Title of publication |
Structure-Property Studies of P-Triarylamine-Substituted Dithieno[3,2-b:2',3'-d]phospholes |
| Authors of publication |
Puntscher, Hannes; Kautny, Paul; Stoeger, Berthold; Tissot, Antoine; Hametner, Christian; Hagemann, Hans; Fröhlich, Johannes; Baumgartner, Thomas; Lumpi, Daniel |
| Journal of publication |
RSC Adv. |
| Year of publication |
2015 |
| a |
8.3295 ± 0.0006 Å |
| b |
14.1464 ± 0.001 Å |
| c |
8.8132 ± 0.0006 Å |
| α |
90° |
| β |
103.153 ± 0.0019° |
| γ |
90° |
| Cell volume |
1011.24 ± 0.12 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
6 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.0201 |
| Residual factor for significantly intense reflections |
0.0198 |
| Weighted residual factors for significantly intense reflections |
0.0272 |
| Weighted residual factors for all reflections included in the refinement |
0.0273 |
| Goodness-of-fit parameter for significantly intense reflections |
1.92 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.92 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7223026.html