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Information card for entry 7223222
Preview
| Coordinates | 7223222.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H34 Cl6 O4 P2 Sn2 |
|---|---|
| Calculated formula | C42 H34 Cl6 O4 P2 Sn2 |
| SMILES | c1(ccccc1)[Sn]([O]=P(Oc1ccc(OP(=[O][Sn](c2ccccc2)(Cl)(Cl)Cl)(c2ccccc2)c2ccccc2)cc1)(c1ccccc1)c1ccccc1)(Cl)(Cl)Cl |
| Title of publication | Supramolecular assemblies of organotin(IV)-diphosphoryl adducts: Insights from X-rays and DFT |
| Authors of publication | Gholivand, Khodayar; Gholami, Akram; Schenk, Kurt; Esrafili, Mehdi; Farshadfar, Kaveh |
| Journal of publication | RSC Adv. |
| Year of publication | 2015 |
| a | 9.0016 ± 0.0012 Å |
| b | 9.2252 ± 0.0012 Å |
| c | 14.687 ± 0.002 Å |
| α | 78.123 ± 0.01° |
| β | 87.443 ± 0.011° |
| γ | 67.904 ± 0.01° |
| Cell volume | 1105.1 ± 0.3 Å3 |
| Cell temperature | 292 ± 2 K |
| Ambient diffraction temperature | 292 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0271 |
| Residual factor for significantly intense reflections | 0.023 |
| Weighted residual factors for significantly intense reflections | 0.0656 |
| Weighted residual factors for all reflections included in the refinement | 0.0685 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.145 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7223222.html
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