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Information card for entry 7224444
Preview
| Coordinates | 7224444.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H26 Cl3 N6 O3 Sm |
|---|---|
| Calculated formula | C24 H24 Cl3 N6 O3 Sm |
| SMILES | c1ccc2c3c(c4ccc[n]5c4c2[n]1[Sm]5(Cl)(Cl)(Cl)([O]=CN(C)C)([O]=CN(C)C)[OH2])nc1c(cccc1)n3 |
| Title of publication | Photosensitized samarium(iii) and erbium(iii) complexes of planar N,N-donor heterocyclic bases: crystal structures and evaluation of biological activity |
| Authors of publication | Dasari, Srikanth; Abbas, Zafar; Kumar, Priyaranjan; Patra, Ashis K. |
| Journal of publication | CrystEngComm |
| Year of publication | 2016 |
| Journal volume | 18 |
| Journal issue | 23 |
| Pages of publication | 4313 |
| a | 7.0374 ± 0.0007 Å |
| b | 9.4788 ± 0.001 Å |
| c | 20.619 ± 0.002 Å |
| α | 93.687 ± 0.003° |
| β | 99.462 ± 0.003° |
| γ | 98.885 ± 0.002° |
| Cell volume | 1334.7 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0375 |
| Residual factor for significantly intense reflections | 0.0297 |
| Weighted residual factors for significantly intense reflections | 0.0755 |
| Weighted residual factors for all reflections included in the refinement | 0.0928 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.194 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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