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Information card for entry 7225038
Preview
| Coordinates | 7225038.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 2-tellura-1,3-dithiaferrocenophane |
|---|---|
| Formula | C10 H8 Fe S2 Te |
| Calculated formula | C10 H8 Fe S2 Te |
| SMILES | [Te]1S[c]23[cH]4[Fe]56789%102([cH]3[cH]5[cH]46)[c]2([cH]%10[cH]9[cH]8[cH]72)S1 |
| Title of publication | Chalcogen‒chalcogen secondary bonding interactions in trichalcogenaferrocenophanes |
| Authors of publication | Karjalainen, Minna M.; Sanchez-Perez, Clara; Rautiainen, J. Mikko; Oilunkaniemi, Raija; Laitinen, Risto S. |
| Journal of publication | CrystEngComm |
| Year of publication | 2016 |
| Journal volume | 18 |
| Journal issue | 24 |
| Pages of publication | 4538 |
| a | 13.883 ± 0.003 Å |
| b | 5.6927 ± 0.0011 Å |
| c | 13.226 ± 0.003 Å |
| α | 90° |
| β | 90.43 ± 0.03° |
| γ | 90° |
| Cell volume | 1045.2 ± 0.4 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0319 |
| Residual factor for significantly intense reflections | 0.0281 |
| Weighted residual factors for significantly intense reflections | 0.0759 |
| Weighted residual factors for all reflections included in the refinement | 0.0793 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7225038.html
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structural data.