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Information card for entry 7225041
Preview
| Coordinates | 7225041.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 1,3-ditellura-2-thiaferrocenophane |
|---|---|
| Formula | C10 H8 Fe S Te2 |
| Calculated formula | C10 H8 Fe S Te2 |
| SMILES | [Te]1S[Te][c]23[cH]4[Fe]56789%102([c]21[cH]8[cH]7[cH]6[cH]52)[cH]3[cH]9[cH]4%10 |
| Title of publication | Chalcogen‒chalcogen secondary bonding interactions in trichalcogenaferrocenophanes |
| Authors of publication | Karjalainen, Minna M.; Sanchez-Perez, Clara; Rautiainen, J. Mikko; Oilunkaniemi, Raija; Laitinen, Risto S. |
| Journal of publication | CrystEngComm |
| Year of publication | 2016 |
| Journal volume | 18 |
| Journal issue | 24 |
| Pages of publication | 4538 |
| a | 13.514 ± 0.003 Å |
| b | 10.494 ± 0.002 Å |
| c | 16.226 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2301.1 ± 0.8 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.1264 |
| Residual factor for significantly intense reflections | 0.0683 |
| Weighted residual factors for significantly intense reflections | 0.0819 |
| Weighted residual factors for all reflections included in the refinement | 0.0933 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.168 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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