Information card for entry 7225550
| Formula |
C28 H22 F6 S2 |
| Calculated formula |
C28 H22 F6 S2 |
| SMILES |
CC(C)c1c(c2ccccc2s1)C1=C(C(C(C1(F)F)(F)F)(F)F)c1c(C)sc(c1C)c1ccccc1 |
| Title of publication |
Photoinduced topographical changes on microcrystalline surfaces of diarylethenes |
| Authors of publication |
Fujinaga, Noriko; Nishikawa, Naoki; Nishimura, Ryo; Hyodo, Kengo; Yamazoe, Seiji; Kojima, Yuko; Yamamoto, Kazuki; Tsujioka, Tsuyoshi; Morimoto, Masakazu; Yokojima, Satoshi; Nakamura, Shinichiro; Uchida, Kingo |
| Journal of publication |
CrystEngComm |
| Year of publication |
2016 |
| Journal volume |
18 |
| Journal issue |
38 |
| Pages of publication |
7229 |
| a |
10.1677 ± 0.0005 Å |
| b |
14.6615 ± 0.0008 Å |
| c |
17.0409 ± 0.0009 Å |
| α |
90° |
| β |
106.069 ± 0.001° |
| γ |
90° |
| Cell volume |
2441.1 ± 0.2 Å3 |
| Cell temperature |
93 ± 2 K |
| Ambient diffraction temperature |
93 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0443 |
| Residual factor for significantly intense reflections |
0.0399 |
| Weighted residual factors for significantly intense reflections |
0.0919 |
| Weighted residual factors for all reflections included in the refinement |
0.0941 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.08 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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