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Information card for entry 7226105
Preview
| Coordinates | 7226105.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H21.33 N3 O3.67 V |
|---|---|
| Calculated formula | C22 H21.3333 N3 O3.66667 V |
| SMILES | [V]12(=O)(=O)Oc3c(C=[N]2c2cccc4ccc[n]1c24)cc1CCCN2CCCc3c12.O |
| Title of publication | Dioxo-vanadium(V), oxo-rhenium(V) and dioxo-uranium(VI) complexes with a tridentate Schiff base ligand |
| Authors of publication | Zhang, Yingjie; Fanna, Daniel; Shepherd, Nicholas D.; Karatchevtseva, Inna; Lu, Kim; Kong, Linggen; Price, Jason R. |
| Journal of publication | RSC Adv. |
| Year of publication | 2016 |
| a | 15.39 ± 0.003 Å |
| b | 17.48 ± 0.004 Å |
| c | 22.77 ± 0.005 Å |
| α | 100.25 ± 0.03° |
| β | 98.44 ± 0.03° |
| γ | 106.11 ± 0.03° |
| Cell volume | 5665 ± 3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0703 |
| Residual factor for significantly intense reflections | 0.0605 |
| Weighted residual factors for significantly intense reflections | 0.1619 |
| Weighted residual factors for all reflections included in the refinement | 0.1703 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 0.71074 Å |
| Diffraction radiation type | silicondoublecrystalmonochromatedsynchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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