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Information card for entry 7227045
Preview
| Coordinates | 7227045.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H10 F4 N5 |
|---|---|
| Calculated formula | C22 H10 F4 N5 |
| SMILES | FC1C(C(F)=C(F)C(C=1F)=C(C#N)C#N)=C(C#N)C#N.[n+]1(c2c(ccc1)cccc2)C |
| Title of publication | Structural and optical investigations of charge transfer complexes involving the radical anions of TCNQ and F4TCNQ |
| Authors of publication | Sutton, Ashley L.; Abrahams, Brendan F.; D'Alessandro, Deanna M.; Hudson, Timothy A.; Robson, Richard; Usov, Pavel M. |
| Journal of publication | CrystEngComm |
| Year of publication | 2016 |
| Journal volume | 18 |
| Journal issue | 46 |
| Pages of publication | 8906 |
| a | 11.9675 ± 0.0003 Å |
| b | 10.4959 ± 0.0003 Å |
| c | 14.5659 ± 0.0003 Å |
| α | 90° |
| β | 92.307 ± 0.002° |
| γ | 90° |
| Cell volume | 1828.14 ± 0.08 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 0.1 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0721 |
| Residual factor for significantly intense reflections | 0.0646 |
| Weighted residual factors for significantly intense reflections | 0.1812 |
| Weighted residual factors for all reflections included in the refinement | 0.1891 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
| Diffraction radiation wavelength | 1.5418 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7227045.html
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Users of the data should acknowledge the original authors of the
structural data.