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Information card for entry 7227052
Preview
| Coordinates | 7227052.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H28 N12 |
|---|---|
| Calculated formula | C40 H28 N12 |
| SMILES | C[n+]1ccn(c1)Cc1ccc(Cn2cc[n+](c2)C)cc1.C1(C=CC(C=C1)=C(C#N)C#N)=C(C#N)C#N.C1=CC(C=CC1=C(C#N)C#N)=C(C#N)C#N |
| Title of publication | Structural and optical investigations of charge transfer complexes involving the radical anions of TCNQ and F4TCNQ |
| Authors of publication | Sutton, Ashley L.; Abrahams, Brendan F.; D'Alessandro, Deanna M.; Hudson, Timothy A.; Robson, Richard; Usov, Pavel M. |
| Journal of publication | CrystEngComm |
| Year of publication | 2016 |
| Journal volume | 18 |
| Journal issue | 46 |
| Pages of publication | 8906 |
| a | 6.6808 ± 0.0002 Å |
| b | 13.9762 ± 0.0005 Å |
| c | 18.9142 ± 0.0007 Å |
| α | 96.805 ± 0.003° |
| β | 100.163 ± 0.003° |
| γ | 95.734 ± 0.003° |
| Cell volume | 1712.87 ± 0.1 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0428 |
| Residual factor for significantly intense reflections | 0.0344 |
| Weighted residual factors for significantly intense reflections | 0.0915 |
| Weighted residual factors for all reflections included in the refinement | 0.0964 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7227052.html
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Users of the data should acknowledge the original authors of the
structural data.