Information card for entry 7228834
| Formula |
C14 H18 F6 O2 P S8 |
| Calculated formula |
C14 H18 F6 O2 P S8 |
| Title of publication |
New semiconducting radical-cation salts of chiral bis(2-hydroxylpropylthio)ethylenedithio TTF |
| Authors of publication |
Lopez, Jordan R.; Martin, Lee; Wallis, John D.; Akutsu, Hiroki; Yamada, Jun-ichi; Nakatsuji, Shin-ichi; Wilson, Claire; Christensen, Jeppe; Coles, Simon J. |
| Journal of publication |
CrystEngComm |
| Year of publication |
2017 |
| a |
7.937 ± 0.0007 Å |
| b |
21.4936 ± 0.0016 Å |
| c |
27.622 ± 0.003 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
4712.2 ± 0.7 Å3 |
| Cell temperature |
298 K |
| Ambient diffraction temperature |
298 K |
| Number of distinct elements |
6 |
| Space group number |
20 |
| Hermann-Mauguin space group symbol |
C 2 2 21 |
| Hall space group symbol |
C 2c 2 |
| Residual factor for significantly intense reflections |
0.0517 |
| Weighted residual factors for all reflections included in the refinement |
0.1618 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.199 |
| Diffraction radiation wavelength |
0.71075 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/7228834.html
