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Information card for entry 7232769
Preview
| Coordinates | 7232769.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Type I silicon-gallium clathrate |
|---|---|
| Chemical name | sodium strontium gallium silicon |
| Formula | Ga8.4 Na4.2 Si37.6 Sr3.8 |
| Calculated formula | Ga8.3984 Na4.2 Si37.6016 Sr3.8 |
| Title of publication | Single crystal growth and structure analysis of type-I (Na/Sr)‒(Ga/Si) quaternary clathrates |
| Authors of publication | Urushiyama, Hironao; Morito, Haruhiko; Yamane, Hisanori |
| Journal of publication | RSC Advances |
| Year of publication | 2019 |
| Journal volume | 9 |
| Journal issue | 26 |
| Pages of publication | 14586 |
| a | 10.3747 ± 0.0003 Å |
| b | 10.3747 ± 0.0003 Å |
| c | 10.3747 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1116.67 ± 0.06 Å3 |
| Cell temperature | 302 ± 2 K |
| Ambient diffraction temperature | 302 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 223 |
| Hermann-Mauguin space group symbol | P m -3 n |
| Hall space group symbol | -P 4n 2 3 |
| Residual factor for all reflections | 0.0125 |
| Residual factor for significantly intense reflections | 0.0113 |
| Weighted residual factors for significantly intense reflections | 0.0283 |
| Weighted residual factors for all reflections included in the refinement | 0.0287 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.191 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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