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Information card for entry 7236116
Preview
| Coordinates | 7236116.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | bis(3,5-difluorophenoxy) silicon phthalocyanine |
|---|---|
| Formula | C44 H22 F4 N8 O2 Si |
| Calculated formula | C44 H22 F4 N8 O2 Si |
| Title of publication | The position and frequency of fluorine atoms changes the electron donor/acceptor properties of fluorophenoxy silicon phthalocyanines within organic photovoltaic devices |
| Authors of publication | Lessard, Benoît H.; Grant, Trevor M.; White, Robin; Thibau, Emmanuel; Lu, Zheng-Hong; Bender, Timothy P. |
| Journal of publication | Journal of Materials Chemistry A |
| Year of publication | 2015 |
| Journal volume | 3 |
| Journal issue | 48 |
| Pages of publication | 24512 |
| a | 8.4484 ± 0.0006 Å |
| b | 13.6023 ± 0.0009 Å |
| c | 15.2391 ± 0.001 Å |
| α | 90° |
| β | 97.453 ± 0.003° |
| γ | 90° |
| Cell volume | 1736.4 ± 0.2 Å3 |
| Cell temperature | 147 ± 2 K |
| Ambient diffraction temperature | 147 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0335 |
| Residual factor for significantly intense reflections | 0.0301 |
| Weighted residual factors for significantly intense reflections | 0.0767 |
| Weighted residual factors for all reflections included in the refinement | 0.0792 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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