Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7236119
Preview
| Coordinates | 7236119.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | bis(2,3,4,6-tetrafluorophenoxy) silicon phthalocyanine |
|---|---|
| Formula | C44 H18 F8 N8 O2 Si |
| Calculated formula | C44 H18 F8 N8 O2 Si |
| Title of publication | The position and frequency of fluorine atoms changes the electron donor/acceptor properties of fluorophenoxy silicon phthalocyanines within organic photovoltaic devices |
| Authors of publication | Lessard, Benoît H.; Grant, Trevor M.; White, Robin; Thibau, Emmanuel; Lu, Zheng-Hong; Bender, Timothy P. |
| Journal of publication | Journal of Materials Chemistry A |
| Year of publication | 2015 |
| Journal volume | 3 |
| Journal issue | 48 |
| Pages of publication | 24512 |
| a | 8.4175 ± 0.0008 Å |
| b | 10.1685 ± 0.0009 Å |
| c | 11.5194 ± 0.001 Å |
| α | 72.562 ± 0.003° |
| β | 69.559 ± 0.003° |
| γ | 81.366 ± 0.003° |
| Cell volume | 880.3 ± 0.14 Å3 |
| Cell temperature | 147 ± 2 K |
| Ambient diffraction temperature | 147 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0317 |
| Residual factor for significantly intense reflections | 0.0311 |
| Weighted residual factors for significantly intense reflections | 0.0819 |
| Weighted residual factors for all reflections included in the refinement | 0.0825 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.061 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7236119.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.