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Information card for entry 7236147
Preview
| Coordinates | 7236147.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H36 N4 O4 Sn |
|---|---|
| Calculated formula | C26 H36 N4 O4 Sn |
| Title of publication | New application of fluorescent organotin compounds derived from Schiff bases: synthesis, X-ray structures, photophysical properties, cytotoxicity and fluorescent bioimaging |
| Authors of publication | Jiménez-Pérez, Víctor M.; García-López, María C.; Muñoz-Flores, Blanca M.; Chan-Navarro, Rodrigo; Berrones-Reyes, Jessica C.; Dias, H. V. Rasika; Moggio, Ivana; Arias, Eduardo; Serrano-Mireles, Jesús A.; Chavez-Reyes, Arturo |
| Journal of publication | Journal of Materials Chemistry B |
| Year of publication | 2015 |
| Journal volume | 3 |
| Journal issue | 28 |
| Pages of publication | 5731 |
| a | 19.7987 ± 0.0004 Å |
| b | 10.3272 ± 0.0003 Å |
| c | 27.5213 ± 0.0004 Å |
| α | 90° |
| β | 95.515 ± 0.001° |
| γ | 90° |
| Cell volume | 5601.1 ± 0.2 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0892 |
| Residual factor for significantly intense reflections | 0.055 |
| Weighted residual factors for significantly intense reflections | 0.1315 |
| Weighted residual factors for all reflections included in the refinement | 0.1511 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7236147.html
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structural data.