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Information card for entry 7237336
Preview
| Coordinates | 7237336.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C68 H56 F4 N8 S6 |
|---|---|
| Calculated formula | C68 H56 F8 N8 S6 |
| Title of publication | Oligothiophene quinoids containing a benzo[c]thiophene unit for the stabilization of the quinoidal electronic structure |
| Authors of publication | Yamamoto, Keitaro; Ie, Yutaka; Nitani, Masashi; Tohnai, Norimitsu; Kakiuchi, Fumitoshi; Zhang, Ke; Pisula, Wojciech; Asadi, Kamal; Blom, Paul W. M.; Aso, Yoshio |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2018 |
| Journal volume | 6 |
| Journal issue | 28 |
| Pages of publication | 7493 |
| a | 8.196 ± 0.0001 Å |
| b | 17.4528 ± 0.0003 Å |
| c | 22.7194 ± 0.0004 Å |
| α | 85.2769 ± 0.0007° |
| β | 88.8887 ± 0.0009° |
| γ | 79.7843 ± 0.0011° |
| Cell volume | 3187.44 ± 0.09 Å3 |
| Cell temperature | 296 K |
| Ambient diffraction temperature | 296 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1056 |
| Residual factor for significantly intense reflections | 0.0744 |
| Weighted residual factors for significantly intense reflections | 0.1973 |
| Weighted residual factors for all reflections included in the refinement | 0.2269 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
| Diffraction radiation wavelength | 0.8 Å |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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