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Information card for entry 7237525
Preview
| Coordinates | 7237525.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H48 F12 O2 P2 S20 |
|---|---|
| Calculated formula | C48 H48 F12 O2 P2 S20 |
| Title of publication | Tuning the electronic properties and the planarity degree in the π-extended TTF series: the prominent role of heteroatoms |
| Authors of publication | Krykun, Serhii; Croué, Vincent; Allain, Magali; Voitenko, Zoia; Aragó, Juan; Ortí, Enrique; Goeb, Sébastien; Sallé, Marc |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2018 |
| Journal volume | 6 |
| Journal issue | 48 |
| Pages of publication | 13190 |
| a | 10.185 ± 0.0006 Å |
| b | 13.7241 ± 0.0006 Å |
| c | 24.2742 ± 0.0011 Å |
| α | 104.2 ± 0.004° |
| β | 90.154 ± 0.004° |
| γ | 111.727 ± 0.005° |
| Cell volume | 3039.2 ± 0.3 Å3 |
| Cell temperature | 200 ± 0.1 K |
| Ambient diffraction temperature | 200 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0802 |
| Residual factor for significantly intense reflections | 0.0554 |
| Weighted residual factors for significantly intense reflections | 0.1207 |
| Weighted residual factors for all reflections included in the refinement | 0.1383 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.006 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7237525.html
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Users of the data should acknowledge the original authors of the
structural data.