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Information card for entry 7242260
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| Coordinates | 7242260.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Sulfonamide chalcone |
|---|---|
| Chemical name | (E)-3-(2-methoxyphenyl)-1-(2-(phenylsulfonylamine)phenyl)prop-2-en-1-one |
| Formula | C21 H16 N2 O5 S |
| Calculated formula | C21 H16 N2 O5 S |
| SMILES | S(=O)(=O)(Nc1c(C(=O)/C=C/c2cc(N(=O)=O)ccc2)cccc1)c1ccccc1 |
| Title of publication | Second-order nonlinear optical properties of two chalcone derivatives: insights from sum-over-states |
| Authors of publication | Custodio, Jean; d'Oliveira, Giulio Demetrius Creazo; Gotardo, Fernando; Cocca, Leandro; Boni, Leonardo De; Perez, Caridad; Napolitano, Hamilton; Osório, Francisco; Valverde, Clodoaldo |
| Journal of publication | Physical Chemistry Chemical Physics |
| Year of publication | 2021 |
| a | 14.0149 ± 0.0016 Å |
| b | 7.6562 ± 0.0009 Å |
| c | 18.38 ± 0.002 Å |
| α | 90° |
| β | 101.242 ± 0.004° |
| γ | 90° |
| Cell volume | 1934.3 ± 0.4 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296.15 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0857 |
| Residual factor for significantly intense reflections | 0.0528 |
| Weighted residual factors for significantly intense reflections | 0.1066 |
| Weighted residual factors for all reflections included in the refinement | 0.1193 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7242260.html
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structural data.