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Information card for entry 7242488
Preview
| Coordinates | 7242488.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H42 Cl2 Zr |
|---|---|
| Calculated formula | C32 H42 Cl2 Zr |
| SMILES | [cH]12[c]3([c]4([c]56c(c(c(c([c]15[Zr]15782346([cH]2[c]1([c]5([c]18[c]72c(c(c(c1C)C)C)C)CC)C)(Cl)Cl)C)C)C)C)CC)C |
| Title of publication | Synthesis of zirconocene complexes and their use in slurry-phase polymerisation of ethylene |
| Authors of publication | Angpanitcharoen, Phakpoom; Lamb, Jessica V.; Buffet, Jean-Charles; Turner, Zoë R.; O'Hare, Dermot |
| Journal of publication | RSC Advances |
| Year of publication | 2021 |
| Journal volume | 11 |
| Journal issue | 19 |
| Pages of publication | 11529 - 11535 |
| a | 11.2859 ± 0.0001 Å |
| b | 15.3811 ± 0.0002 Å |
| c | 16.5363 ± 0.0002 Å |
| α | 90° |
| β | 94.569 ± 0.001° |
| γ | 90° |
| Cell volume | 2861.41 ± 0.06 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 149.9 ± 0.4 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0341 |
| Residual factor for significantly intense reflections | 0.0245 |
| Weighted residual factors for significantly intense reflections | 0.0561 |
| Weighted residual factors for all reflections included in the refinement | 0.0602 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.012 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7242488.html
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Users of the data should acknowledge the original authors of the
structural data.