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Information card for entry 7243066
Preview
| Coordinates | 7243066.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H22 Si2 |
|---|---|
| Calculated formula | C24 H22 Si2 |
| SMILES | c1(ccccc1)[Si]1(c2ccccc2)c2cccc3cccc(c23)[Si]1(C)C |
| Title of publication | The photophysical properties of naphthalene bridged disilanes |
| Authors of publication | Kumar, Vipin B.; Fleming, Cassandra L.; Murali, Sai Shruthi; Hume, Paul A.; Davis, Nathaniel J. L. K.; Söhnel, Tilo; Leitao, Erin M. |
| Journal of publication | RSC Advances |
| Year of publication | 2021 |
| Journal volume | 11 |
| Journal issue | 35 |
| Pages of publication | 21343 - 21350 |
| a | 7.7979 ± 0.0002 Å |
| b | 36.7369 ± 0.0006 Å |
| c | 14.1416 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4051.15 ± 0.14 Å3 |
| Cell temperature | 100.7 ± 0.7 K |
| Ambient diffraction temperature | 100.7 ± 0.7 K |
| Number of distinct elements | 3 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0414 |
| Residual factor for significantly intense reflections | 0.0341 |
| Weighted residual factors for significantly intense reflections | 0.0795 |
| Weighted residual factors for all reflections included in the refinement | 0.0824 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7243066.html
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Users of the data should acknowledge the original authors of the
structural data.