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Information card for entry 7244206
Preview
| Coordinates | 7244206.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H25 Cl2 Fe N5 |
|---|---|
| Calculated formula | C10 H25 Cl2 Fe N5 |
| Title of publication | Expanding and quantifying the crystal chemistry of the flexible ligand 15aneN5 |
| Authors of publication | Shircliff, Anthony D.; Allbritton, Elisabeth M. A.; Davilla, Dustin J.; Gorbet, Michael-Joseph; Jones, Donald G.; Tresp, David S.; Allen, Michael B.; Shrestha, Alina; Burgess, Gwendolyn E.; Eze, John I.; Fernandez, Andrea T.; Ramirez, Daniel; Shoff, Kody J.; Crispin, Garet G.; Crone, Sarah B.; Flinn, Michael; Tran, Tien; Bryce, Darby S.; Bond, Abbagale L.; Shockey, Dylan W.; Oliver, Allen G.; Krause, Jeanette A.; Prior, Timothy J.; Hubin, Timothy J. |
| Journal of publication | CrystEngComm |
| Year of publication | 2022 |
| Journal volume | 24 |
| Journal issue | 6 |
| Pages of publication | 1218 - 1236 |
| a | 7.9184 ± 0.0006 Å |
| b | 6.7907 ± 0.0005 Å |
| c | 14.7266 ± 0.0011 Å |
| α | 90° |
| β | 100.133 ± 0.002° |
| γ | 90° |
| Cell volume | 779.52 ± 0.1 Å3 |
| Cell temperature | 150.15 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0231 |
| Residual factor for significantly intense reflections | 0.0203 |
| Weighted residual factors for significantly intense reflections | 0.0515 |
| Weighted residual factors for all reflections included in the refinement | 0.0529 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.061 |
| Diffraction radiation wavelength | 0.7749 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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