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Information card for entry 7244209
Preview
| Coordinates | 7244209.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H25 F12 N5 P2 Zn |
|---|---|
| Calculated formula | C10 H25 F11.996 N5 P2 Zn |
| Title of publication | Expanding and quantifying the crystal chemistry of the flexible ligand 15aneN5 |
| Authors of publication | Shircliff, Anthony D.; Allbritton, Elisabeth M. A.; Davilla, Dustin J.; Gorbet, Michael-Joseph; Jones, Donald G.; Tresp, David S.; Allen, Michael B.; Shrestha, Alina; Burgess, Gwendolyn E.; Eze, John I.; Fernandez, Andrea T.; Ramirez, Daniel; Shoff, Kody J.; Crispin, Garet G.; Crone, Sarah B.; Flinn, Michael; Tran, Tien; Bryce, Darby S.; Bond, Abbagale L.; Shockey, Dylan W.; Oliver, Allen G.; Krause, Jeanette A.; Prior, Timothy J.; Hubin, Timothy J. |
| Journal of publication | CrystEngComm |
| Year of publication | 2022 |
| Journal volume | 24 |
| Journal issue | 6 |
| Pages of publication | 1218 - 1236 |
| a | 12.6817 ± 0.001 Å |
| b | 25.67 ± 0.003 Å |
| c | 12.8729 ± 0.001 Å |
| α | 90° |
| β | 106.102 ± 0.007° |
| γ | 90° |
| Cell volume | 4026.2 ± 0.7 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | I 1 2/a 1 |
| Hall space group symbol | -I 2ya |
| Residual factor for all reflections | 0.0788 |
| Residual factor for significantly intense reflections | 0.0628 |
| Weighted residual factors for significantly intense reflections | 0.1758 |
| Weighted residual factors for all reflections included in the refinement | 0.1896 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
| Diffraction radiation wavelength | 0.7749 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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