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Information card for entry 7244369
Preview
| Coordinates | 7244369.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H34 Co2 N12 O46 Si W12 |
|---|---|
| Calculated formula | C32 H34 Co2 N12 O46 Si W12 |
| Title of publication | Various amide derivatives induced Keggin-type SiW12O404−-based cobalt complexes: assembly, structure, electrochemical sensing and dye adsorption properties |
| Authors of publication | Li, Lei; Zhang, Yue; Wang, Xiang; Xu, Na; Li, Xiao-Hui; Wang, Xiu-Li |
| Journal of publication | CrystEngComm |
| Year of publication | 2022 |
| Journal volume | 24 |
| Journal issue | 6 |
| Pages of publication | 1195 - 1202 |
| a | 11.4528 ± 0.0017 Å |
| b | 11.5586 ± 0.0016 Å |
| c | 14.2713 ± 0.0019 Å |
| α | 77.001 ± 0.003° |
| β | 89.888 ± 0.003° |
| γ | 78.24 ± 0.003° |
| Cell volume | 1800.3 ± 0.4 Å3 |
| Cell temperature | 296.15 K |
| Ambient diffraction temperature | 296.15 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0881 |
| Residual factor for significantly intense reflections | 0.0496 |
| Weighted residual factors for significantly intense reflections | 0.0952 |
| Weighted residual factors for all reflections included in the refinement | 0.1091 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.95 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Diffraction radiation X-ray symbol | K-L~3~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7244369.html
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