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Information card for entry 7244375
Preview
| Coordinates | 7244375.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | ([4]heliceneSO3)2(TMTTF)2 |
|---|---|
| Formula | C28 H23 O3 S5 |
| Calculated formula | C28 H23 O3 S5 |
| SMILES | O=S(=O)([O-])c1c2ccc3c(c4c(cccc4)cc3)c2ccc1.S1C(=C(SC1=C1SC(=C(S1)C)C)C)C |
| Title of publication | [4]Helicene based anions in electrocrystallization with tetrachalcogenafulvalene donors |
| Authors of publication | zigon, nicolas; Avarvari, Narcis |
| Journal of publication | CrystEngComm |
| Year of publication | 2022 |
| a | 12.5199 ± 0.0009 Å |
| b | 21.0758 ± 0.0015 Å |
| c | 19.3165 ± 0.001 Å |
| α | 90° |
| β | 102.089 ± 0.006° |
| γ | 90° |
| Cell volume | 4984 ± 0.6 Å3 |
| Cell temperature | 150.01 ± 0.1 K |
| Ambient diffraction temperature | 150.01 ± 0.1 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1446 |
| Residual factor for significantly intense reflections | 0.0952 |
| Weighted residual factors for significantly intense reflections | 0.2419 |
| Weighted residual factors for all reflections included in the refinement | 0.2851 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7244375.html
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