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Information card for entry 7247671
Preview
| Coordinates | 7247671.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H8 I3 N4 S10 |
|---|---|
| Calculated formula | C20 H8 I3 N4 S10 |
| Title of publication | High pressure behaviour of the organic semiconductor salt (TTF-BTD)<sub>2</sub>I<sub>3</sub>. |
| Authors of publication | Montisci, Fabio; Lanza, Arianna; Fisch, Martin; Sonneville, Camille; Geng, Yan; Decurtins, Silvio; Reber, Christian; Liu, Shi-Xia; Macchi, Piero |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2023 |
| Journal volume | 25 |
| Journal issue | 45 |
| Pages of publication | 31410 - 31417 |
| a | 20.7153 ± 0.0006 Å |
| b | 9.9754 ± 0.0003 Å |
| c | 7.3562 ± 0.0002 Å |
| α | 90° |
| β | 107.185 ± 0.002° |
| γ | 90° |
| Cell volume | 1452.25 ± 0.07 Å3 |
| Cell temperature | 323 ± 2 K |
| Ambient diffraction temperature | 323 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0404 |
| Residual factor for significantly intense reflections | 0.0326 |
| Weighted residual factors for significantly intense reflections | 0.0852 |
| Weighted residual factors for all reflections included in the refinement | 0.0905 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.