Information card for entry 7251083

Structure parameters

• Formula: C16 H17 F5 S Si
• Calculated formula: C16 H17 F5 S Si
• Title of publication: Systematic Investigation of the Effect of Trialkylsilyl Groups on the Crystal Structures of Perfluorophenyl-Substituted Thiophene
• Authors of publication: Yonezawa, Takeharu; Ito, Hajime; Jin, Mingoo
• Journal of publication: CrystEngComm
• Year of publication: 2025
• a: 7.453 ± 0.0003 Å
• b: 7.5747 ± 0.0002 Å
• c: 17.1723 ± 0.0005 Å
• α: 85.62 ± 0.002°
• β: 80.227 ± 0.003°
• γ: 61.642 ± 0.004°
• Cell volume: 840.72 ± 0.06 ų
• Cell temperature: 153 K
• Ambient diffraction temperature: 153 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0442
• Residual factor for significantly intense reflections: 0.0391
• Weighted residual factors for significantly intense reflections: 0.1131
• Weighted residual factors for all reflections included in the refinement: 0.1165
• Goodness-of-fit parameter for all reflections included in the refinement: 1.126
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No