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Information card for entry 7701961
Preview
| Coordinates | 7701961.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Formula | C36 H52 Cu N2 O2 |
|---|---|
| Calculated formula | C36 H52 Cu N2 O2 |
| Title of publication | Shedding light on the use of Cu(ii)-salen complexes in the A<sup>3</sup> coupling reaction. |
| Authors of publication | Sampani, Stavroula I.; Zdorichenko, Victor; Danopoulou, Marianna; Leech, Matthew C.; Lam, Kevin; Abdul-Sada, Alaa; Cox, Brian; Tizzard, Graham J.; Coles, Simon J.; Tsipis, Athanassios; Kostakis, George E. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2020 |
| Journal volume | 49 |
| Journal issue | 2 |
| Pages of publication | 289 - 299 |
| a | 9.874 ± 0.0004 Å |
| b | 13.5904 ± 0.0005 Å |
| c | 14.8719 ± 0.0006 Å |
| α | 62.868 ± 0.004° |
| β | 73.368 ± 0.003° |
| γ | 78.772 ± 0.003° |
| Cell volume | 1696.94 ± 0.13 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 1 |
| Hermann-Mauguin space group symbol | P 1 |
| Hall space group symbol | P 1 |
| Residual factor for all reflections | 0.1108 |
| Residual factor for significantly intense reflections | 0.0655 |
| Weighted residual factors for significantly intense reflections | 0.1097 |
| Weighted residual factors for all reflections included in the refinement | 0.1276 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Diffraction radiation X-ray symbol | K-L~3~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7701961.html
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Users of the data should acknowledge the original authors of the
structural data.