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Information card for entry 7702369
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| Coordinates | 7702369.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Copper-selenide-nanocluster |
|---|---|
| Chemical name | The CIF file for the structure of Nr. 6 |
| Formula | C216 H540 Cu140 P36 Se70 |
| Calculated formula | C137 Cu140.02 P36 Se70 |
| Title of publication | Novel Cu‒Se clusters with Se‒layer structures: [Cu32Se7(SenBu)18(PiPr3)6], [Cu50Se20(SetBu)10(PiPr3)10], [Cu73Se35(SePh)3(PiPr3)21], [Cu140Se70(PEt3)34] and [Cu140Se70(PEt3)36] |
| Authors of publication | Zhu, Nianyong; Fenske, Dieter |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 1999 |
| Journal issue | 7 |
| Pages of publication | 1067 |
| a | 31.65 ± 0.006 Å |
| b | 22.55 ± 0.005 Å |
| c | 37.84 ± 0.008 Å |
| α | 90° |
| β | 97.92 ± 0.03° |
| γ | 90° |
| Cell volume | 26749 ± 10 Å3 |
| Cell temperature | 203 ± 2 K |
| Ambient diffraction temperature | 203 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 11 |
| Hermann-Mauguin space group symbol | P 1 21/m 1 |
| Hall space group symbol | -P 2yb |
| Residual factor for all reflections | 0.2611 |
| Residual factor for significantly intense reflections | 0.0867 |
| Weighted residual factors for all reflections | 0.3236 |
| Weighted residual factors for significantly intense reflections | 0.2196 |
| Goodness-of-fit parameter for all reflections | 1.092 |
| Goodness-of-fit parameter for significantly intense reflections | 1.44 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKa |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7702369.html
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Users of the data should acknowledge the original authors of the
structural data.