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Information card for entry 7704393
Preview
| Coordinates | 7704393.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | EuAgSeF |
|---|---|
| Chemical name | EuAgSeF |
| Formula | Ag Eu F Se |
| Calculated formula | Ag Eu F Se |
| Title of publication | Synthesis, electronic structure and physical properties of two new layered compounds, EuFAgSe and EuFAg<sub>1-δ</sub>Te, featuring the active redox pair Eu<sup>2+</sup>/Ag<sup/>. |
| Authors of publication | Plokhikh, Igor V.; Tsirlin, Alexander A.; Heletta, Lukas; Klenner, Steffen; Charkin, Dmitri O.; Kuznetsov, Alexey N.; Shevelkov, Andrei V.; Pöttgen, Rainer; Pfitzner, Arno |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2020 |
| Journal volume | 49 |
| Journal issue | 22 |
| Pages of publication | 7426 - 7435 |
| a | 4.15427 ± 0.00003 Å |
| b | 4.15427 ± 0.00003 Å |
| c | 9.2183 ± 0.0001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 159.089 ± 0.002 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Ambient diffracton pressure | 100 kPa |
| Number of distinct elements | 4 |
| Space group number | 129 |
| Hermann-Mauguin space group symbol | P 4/n m m :2 |
| Hall space group symbol | -P 4a 2a |
| Residual factor for all reflections | 0.0276 |
| Residual factor for significantly intense reflections | 0.0219 |
| Weighted residual factors for all reflections | 0.0253 |
| Weighted residual factors for significantly intense reflections | 0.0241 |
| Goodness-of-fit parameter for all reflections | 2.04 |
| Method of determination | powder diffraction |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.7093 Å |
| Diffraction radiation type | MoKα~1~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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