Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7704430
Preview
| Coordinates | 7704430.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H84 Li O3 Sc Si6 |
|---|---|
| Calculated formula | C34 H84 Li O3 Sc Si6 |
| Title of publication | Scandium bis(trimethylsilyl)methyl complexes revisited: extending the <sup>45</sup>Sc NMR chemical shift range and a new structural motif of Li[CH(SiMe<sub>3</sub>)<sub>2</sub>]. |
| Authors of publication | Mortis, Alexandros; Barisic, Damir; Eichele, Klaus; Maichle-Mössmer, Cäcilia; Anwander, Reiner |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2020 |
| Journal volume | 49 |
| Journal issue | 23 |
| Pages of publication | 7829 - 7841 |
| a | 23.659 ± 0.004 Å |
| b | 12.098 ± 0.002 Å |
| c | 34.338 ± 0.006 Å |
| α | 90° |
| β | 98.579 ± 0.004° |
| γ | 90° |
| Cell volume | 9718 ± 3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1077 |
| Residual factor for significantly intense reflections | 0.0561 |
| Weighted residual factors for significantly intense reflections | 0.1169 |
| Weighted residual factors for all reflections included in the refinement | 0.138 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7704430.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.