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Information card for entry 7704441
Preview
| Coordinates | 7704441.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Formula | C20 H14 I2 N2 O2 |
|---|---|
| Calculated formula | C20 H14 I2 N2 O2 |
| SMILES | c1c(cccc1C(=O)Nc1c(cccc1)I)C(=O)Nc1c(cccc1)I |
| Title of publication | Halogenated isophthalamides and dipicolineamides: the role of the halogen substituents in the anion binding properties. |
| Authors of publication | Picci, Giacomo; Bazzicalupi, Carla; Coles, Simon J.; Gratteri, Paola; Isaia, Francesco; Lippolis, Vito; Montis, Riccardo; Murgia, Sergio; Nocentini, Alessio; Orton, James B.; Caltagirone, Claudia |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2020 |
| Journal volume | 49 |
| Journal issue | 27 |
| Pages of publication | 9231 - 9238 |
| a | 19.3177 ± 0.0009 Å |
| b | 4.7632 ± 0.0001 Å |
| c | 22.0266 ± 0.0009 Å |
| α | 90° |
| β | 115.372 ± 0.005° |
| γ | 90° |
| Cell volume | 1831.27 ± 0.14 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0488 |
| Residual factor for significantly intense reflections | 0.0433 |
| Weighted residual factors for significantly intense reflections | 0.1049 |
| Weighted residual factors for all reflections included in the refinement | 0.1081 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.109 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Diffraction radiation X-ray symbol | K-L~3~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7704441.html
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Users of the data should acknowledge the original authors of the
structural data.