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Information card for entry 7704582
Preview
| Coordinates | 7704582.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Formula | C42 H48 N4 Ni O4 |
|---|---|
| Calculated formula | C42 H48 N4 Ni O4 |
| SMILES | [Ni]123Oc4ccccc4C(=[N]2CC[N]3=C(c2ccccc2O1)c1ccccc1OCCN1CCCCC1)c1ccccc1OCCN1CCCCC1 |
| Title of publication | The effect of isomerism and other structural variations on the G-quadruplex DNA-binding properties of some nickel Schiff base complexes. |
| Authors of publication | Pham, Son Q. T.; Richardson, Christopher; Kelso, Celine; Willis, Anthony C.; Ralph, Stephen F. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2020 |
| Journal volume | 49 |
| Journal issue | 30 |
| Pages of publication | 10360 - 10379 |
| a | 10.6471 ± 0.0004 Å |
| b | 26.9276 ± 0.0013 Å |
| c | 28.5309 ± 0.0016 Å |
| α | 65.563 ± 0.005° |
| β | 84.047 ± 0.004° |
| γ | 83.883 ± 0.003° |
| Cell volume | 7388.6 ± 0.7 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1262 |
| Residual factor for significantly intense reflections | 0.0968 |
| Weighted residual factors for all reflections | 0.1945 |
| Weighted residual factors for significantly intense reflections | 0.1772 |
| Weighted residual factors for all reflections included in the refinement | 0.1945 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.9802 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7704582.html
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Users of the data should acknowledge the original authors of the
structural data.