Information card for entry 7704584

Structure parameters

• Formula: C32 H34 N2 Ni O6 S2
• Calculated formula: C32 H34 N2 Ni O6 S2
• SMILES: [Ni]123Oc4ccccc4C(=[N]2CC[N]3=C(c2ccccc2O1)c1c(O)cccc1)c1c(O)cccc1.S(=O)(C)C.S(=O)(C)C
• Title of publication: The effect of isomerism and other structural variations on the G-quadruplex DNA-binding properties of some nickel Schiff base complexes.
• Authors of publication: Pham, Son Q. T.; Richardson, Christopher; Kelso, Celine; Willis, Anthony C.; Ralph, Stephen F.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2020
• Journal volume: 49
• Journal issue: 30
• Pages of publication: 10360 - 10379
• a: 13.1465 ± 0.0001 Å
• b: 14.9679 ± 0.0001 Å
• c: 16.4141 ± 0.0002 Å
• α: 90°
• β: 107.358 ± 0.0011°
• γ: 90°
• Cell volume: 3082.81 ± 0.05 ų
• Cell temperature: 150 K
• Ambient diffraction temperature: 150 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0381
• Residual factor for significantly intense reflections: 0.0362
• Weighted residual factors for all reflections: 0.0993
• Weighted residual factors for significantly intense reflections: 0.0974
• Weighted residual factors for all reflections included in the refinement: 0.0993
• Goodness-of-fit parameter for all reflections included in the refinement: 0.9963
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No