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Information card for entry 7704587
Preview
| Coordinates | 7704587.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | N,N'-Bis-(4'-((1-(2-ethyl)piperidine)oxy)benzophenylidene)ethylenediaminenickel(II) |
|---|---|
| Formula | C43 H48.96 Cl3 N4 Ni O4.15 |
| Calculated formula | C43 H48.968 Cl3 N4 Ni O4.15 |
| Title of publication | The effect of isomerism and other structural variations on the G-quadruplex DNA-binding properties of some nickel Schiff base complexes. |
| Authors of publication | Pham, Son Q. T.; Richardson, Christopher; Kelso, Celine; Willis, Anthony C.; Ralph, Stephen F. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2020 |
| Journal volume | 49 |
| Journal issue | 30 |
| Pages of publication | 10360 - 10379 |
| a | 9.9317 ± 0.0003 Å |
| b | 14.6642 ± 0.0006 Å |
| c | 14.9018 ± 0.0005 Å |
| α | 84.318 ± 0.003° |
| β | 76.97 ± 0.003° |
| γ | 73.292 ± 0.003° |
| Cell volume | 2023.8 ± 0.13 Å3 |
| Cell temperature | 150 ± 0.1 K |
| Ambient diffraction temperature | 150 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0452 |
| Residual factor for significantly intense reflections | 0.0346 |
| Weighted residual factors for significantly intense reflections | 0.0846 |
| Weighted residual factors for all reflections included in the refinement | 0.089 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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