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Information card for entry 7705862
Preview
| Coordinates | 7705862.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C60 H52 Cl2 N2 P4 Zr |
|---|---|
| Calculated formula | C60 H52 Cl2 N2 P4 Zr |
| SMILES | c12ccc3C[P](c4ccccc4)(c4ccccc4)[Zr]4(n23)(n2c(ccc2C[P](c2ccccc2)c2ccccc2)C[P]4(c2ccccc2)c2ccccc2)([P](C1)(c1ccccc1)c1ccccc1)(Cl)Cl |
| Title of publication | Asymmetric bis-PNP pincer complexes of zirconium and hafnium - a measure of hemilability. |
| Authors of publication | Idelson, Celia; Webster, Leah; Krämer, Tobias; Chadwick, F. Mark |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2020 |
| Journal volume | 49 |
| Journal issue | 46 |
| Pages of publication | 16653 - 16656 |
| a | 11.1053 ± 0.0007 Å |
| b | 13.1355 ± 0.0008 Å |
| c | 20.3905 ± 0.001 Å |
| α | 85.224 ± 0.004° |
| β | 86.838 ± 0.004° |
| γ | 66.436 ± 0.006° |
| Cell volume | 2716.2 ± 0.3 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0562 |
| Residual factor for significantly intense reflections | 0.0446 |
| Weighted residual factors for all reflections | 0.1274 |
| Weighted residual factors for significantly intense reflections | 0.1134 |
| Weighted residual factors for all reflections included in the refinement | 0.1274 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.617 |
| Diffraction radiation wavelength | 1.5418 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.