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Information card for entry 7706181
Preview
| Coordinates | 7706181.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C33.94 H32 N4 O4 U |
|---|---|
| Calculated formula | C34 H32 N4 O4 U |
| Title of publication | Systematic comparison of the structure of homoleptic tetradentate N<sub>2</sub>O<sub>2</sub>-type Schiff base complexes of tetravalent f-elements (M(IV) = Ce, Th, U, Np, and Pu) in solid state and in solution. |
| Authors of publication | Radoske, Thomas; Kloditz, Roger; Fichter, Sebastian; März, Juliane; Kaden, Peter; Patzschke, Michael; Schmidt, Moritz; Stumpf, Thorsten; Walter, Olaf; Ikeda-Ohno, Atsushi |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2020 |
| Journal volume | 49 |
| Journal issue | 48 |
| Pages of publication | 17559 - 17570 |
| a | 14.6015 ± 0.0007 Å |
| b | 14.6038 ± 0.0008 Å |
| c | 13.9168 ± 0.0007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2967.6 ± 0.3 Å3 |
| Cell temperature | 106 ± 2 K |
| Ambient diffraction temperature | 105.87 K |
| Number of distinct elements | 5 |
| Space group number | 50 |
| Hermann-Mauguin space group symbol | P b a n :2 |
| Hall space group symbol | -P 2ab 2b |
| Residual factor for all reflections | 0.0337 |
| Residual factor for significantly intense reflections | 0.0251 |
| Weighted residual factors for significantly intense reflections | 0.048 |
| Weighted residual factors for all reflections included in the refinement | 0.0547 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.243 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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