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Information card for entry 7706755
Preview
| Coordinates | 7706755.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C105.39 H180 D22.77 Hf N3 O40.85 P Si3 W9 |
|---|---|
| Calculated formula | C105.352 H180 D22.704 Hf N3 O40.838 P Si3 W9 |
| Title of publication | Development of sterically hindered siloxide-functionalized polyoxotungstates for the complexation of 5d-metals. |
| Authors of publication | Auvray, Thomas; Nachtigall, Olaf; Brennessel, William W.; Jones, William D.; Matson, Ellen M. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2021 |
| Journal volume | 50 |
| Journal issue | 12 |
| Pages of publication | 4300 - 4310 |
| a | 23.6019 ± 0.0002 Å |
| b | 19.823 ± 0.0002 Å |
| c | 29.51 ± 0.0002 Å |
| α | 90° |
| β | 95.867 ± 0.001° |
| γ | 90° |
| Cell volume | 13734.2 ± 0.2 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 9 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0558 |
| Residual factor for significantly intense reflections | 0.0487 |
| Weighted residual factors for significantly intense reflections | 0.1339 |
| Weighted residual factors for all reflections included in the refinement | 0.1389 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.075 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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