Information card for entry 7706878

Structure parameters

• Formula: C52 H104 Cl3 Ge K2 N4 O13 Si2 Y
• Calculated formula: C52 H104 Cl3 Ge K2 N4 O13 Si2 Y
• SMILES: [C]12([Ge][C]3(=[C]4([C]=1(C)[Y]234(Cl)(Cl)Cl)C)[Si](C)(C)C)[Si](C)(C)C.C1C[O]2CC[O]3CC[N]45CC[O]6CC[O]7CC[N]81CC[O]1CC[O](CC4)[K]2356781.C1C[O]2CC[O]3CC[N]45CC[O]6CC[O]7CC[N]81CC[O]1CC[O](CC4)[K]2356781.C1CCCO1
• Title of publication: Yttrium germole dianion complexes with Y-Ge bonds.
• Authors of publication: Liu, Jingjing; Singh, Kalyan; Dutta, Sayan; Feng, Zhongtao; Koley, Debasis; Tan, Gengwen; Wang, Xinping
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2021
• Journal volume: 50
• Journal issue: 16
• Pages of publication: 5552 - 5556
• a: 12.786 ± 0.0003 Å
• b: 19.1015 ± 0.0005 Å
• c: 29.4531 ± 0.0008 Å
• α: 90°
• β: 96.062 ± 0.001°
• γ: 90°
• Cell volume: 7153.2 ± 0.3 ų
• Cell temperature: 120 ± 2 K
• Ambient diffraction temperature: 120 ± 2 K
• Number of distinct elements: 9
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0612
• Residual factor for significantly intense reflections: 0.0381
• Weighted residual factors for significantly intense reflections: 0.084
• Weighted residual factors for all reflections included in the refinement: 0.0905
• Goodness-of-fit parameter for all reflections included in the refinement: 1.031
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No