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Information card for entry 7707605
Preview
| Coordinates | 7707605.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 2-{(E)-((R)-1-(phenyl)ethylimino)(phenyl)methyl}phenol |
|---|---|
| Formula | C21 H19 N O |
| Calculated formula | C21 H19 N O |
| SMILES | Oc1c(cccc1)/C(=N/[C@@H](c1ccccc1)C)c1ccccc1 |
| Title of publication | Pseudotetrahedral copper(II)-complexes with enantiopure (<i>R</i> or <i>S</i>)-2-(((aryl)ethylimino)ethyl)phenolate Schiff base ligands. |
| Authors of publication | Enamullah, Mohammed; Anwar Hossain, Mohammad; Islam, Mohammad Khairul; Woschko, Dennis; Janiak, Christoph |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2021 |
| Journal volume | 50 |
| Journal issue | 26 |
| Pages of publication | 9236 - 9249 |
| a | 9.9056 ± 0.0005 Å |
| b | 8.139 ± 0.0004 Å |
| c | 10.8874 ± 0.0005 Å |
| α | 90° |
| β | 111.182 ± 0.002° |
| γ | 90° |
| Cell volume | 818.46 ± 0.07 Å3 |
| Cell temperature | 140 ± 2 K |
| Ambient diffraction temperature | 140 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0261 |
| Residual factor for significantly intense reflections | 0.0258 |
| Weighted residual factors for significantly intense reflections | 0.0658 |
| Weighted residual factors for all reflections included in the refinement | 0.066 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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