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Information card for entry 7708245
Preview
| Coordinates | 7708245.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H28 N2 O2 Sn |
|---|---|
| Calculated formula | C12 H28 N2 O2 Sn |
| SMILES | [Sn]12(OC(C[N]1(C)C)(C)C)OC(C[N]2(C)C)(C)C |
| Title of publication | Evaluation of Sn(II) Aminoalkoxide Precursors for Atomic Layer Deposition of SnO Thin Films. Invitation: Dalton Transactions web collection themed around the topic of tin chemistry |
| Authors of publication | Johnson, Andrew Lee; Paish, James David; Snook, Michael |
| Journal of publication | Dalton Transactions |
| Year of publication | 2021 |
| a | 8.1592 ± 0.0003 Å |
| b | 13.8664 ± 0.0005 Å |
| c | 14.1626 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1602.34 ± 0.1 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0283 |
| Residual factor for significantly intense reflections | 0.0252 |
| Weighted residual factors for significantly intense reflections | 0.0422 |
| Weighted residual factors for all reflections included in the refinement | 0.043 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7708245.html
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