Information card for entry 7708248

Structure parameters

• Formula: C12 H32 N4 O2 Sn2
• Calculated formula: C12 H32 N4 O2 Sn2
• Title of publication: Evaluation of Sn(II) Aminoalkoxide Precursors for Atomic Layer Deposition of SnO Thin Films. Invitation: Dalton Transactions web collection themed around the topic of tin chemistry
• Authors of publication: Johnson, Andrew Lee; Paish, James David; Snook, Michael
• Journal of publication: Dalton Transactions
• Year of publication: 2021
• a: 6.7833 ± 0.0001 Å
• b: 17.2028 ± 0.0001 Å
• c: 8.1423 ± 0.0001 Å
• α: 90°
• β: 95.988 ± 0.001°
• γ: 90°
• Cell volume: 944.955 ± 0.019 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 0.3 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0183
• Residual factor for significantly intense reflections: 0.0173
• Weighted residual factors for significantly intense reflections: 0.0431
• Weighted residual factors for all reflections included in the refinement: 0.0437
• Goodness-of-fit parameter for all reflections included in the refinement: 1.048
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No