Information card for entry 7708404
| Formula |
C30 H78 Ge2 O3 Si6 Yb |
| Calculated formula |
C30 H78 Ge2 O3 Si6 Yb |
| Title of publication |
Bonding analysis in ytterbium(ii) distannyl and related tetryls |
| Authors of publication |
Chapple, Peter M.; Cartron, Julien; Hamdoun, Ghanem; Cordier, Marie; Kahlal, Samia; Oulyadi, Hassan; Carpentier, Jean-François; Saillard, Jean-Yves; Sarazin, Yann |
| Journal of publication |
Dalton Transactions |
| Year of publication |
2021 |
| a |
18.943 ± 0.003 Å |
| b |
15.0354 ± 0.0017 Å |
| c |
17.129 ± 0.002 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
4878.6 ± 1.1 Å3 |
| Cell temperature |
150 K |
| Ambient diffraction temperature |
150 K |
| Number of distinct elements |
6 |
| Space group number |
33 |
| Hermann-Mauguin space group symbol |
P n a 21 |
| Hall space group symbol |
P 2c -2n |
| Residual factor for all reflections |
0.0342 |
| Residual factor for significantly intense reflections |
0.0265 |
| Weighted residual factors for significantly intense reflections |
0.0516 |
| Weighted residual factors for all reflections included in the refinement |
0.0548 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.058 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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https://www.crystallography.net/7708404.html
