Information card for entry 7708733

Structure parameters

• Formula: C46 H92 K N O Si10
• Calculated formula: C46 H92 K N O Si10
• SMILES: [Si@]1(N(C(C)C)C(C)C)([C@H]2[Si]([Si]([Si](C)(C)C)([Si](C)(C)C)c3ccccc3C2=C(c2ccccc2)[C-]1[Si]([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)(C)C)(C)C)C.[K+].O1CCCC1.[Si@@]1(N(C(C)C)C(C)C)([C@@H]2[Si]([Si]([Si](C)(C)C)([Si](C)(C)C)c3ccccc3C2=C(c2ccccc2)[C-]1[Si]([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)(C)C)(C)C)C.[K+].O1CCCC1
• Title of publication: Silole Allylic Anions Instead of Silanides
• Authors of publication: Pöcheim, Alexander; Albers, Lena; Müller, Thomas; Baumgartner, Judith; Marschner, Christoph
• Journal of publication: Dalton Transactions
• Year of publication: 2021
• a: 17.893 ± 0.004 Å
• b: 13.437 ± 0.003 Å
• c: 25.35 ± 0.005 Å
• α: 90°
• β: 91.669 ± 0.004°
• γ: 90°
• Cell volume: 6092 ± 2 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0952
• Residual factor for significantly intense reflections: 0.0846
• Weighted residual factors for significantly intense reflections: 0.165
• Weighted residual factors for all reflections included in the refinement: 0.1708
• Goodness-of-fit parameter for all reflections included in the refinement: 1.017
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No